St. Louis, MO, United States of America

Daniel Thorek

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Washington University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Thorek. Retrieved from https://idiyas.com/inventor/daniel-thorek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Daniel Thorek and Low-Count Quantitative SPECT Imaging.

Introduction

Daniel Thorek is an inventor based in St. Louis, Missouri, and is associated with Washington University. His work includes an invention for low-count quantitative single-photon emission computed tomography (LC-QSPECT) imaging.

Latest Patents

Thorek is named on one patent: “Systems and Methods for Low-Count Quantitative Projection Domain SPECT Imaging.” The invention describes an LC-QSPECT system that stores a subject’s CT scan and identifies defined volumes of interest (VOIs). It models the probability that photons emitted from each VOI will be detected in different projection bins, then adjusts that model using an analysis of stray-radiation noise. Sensors detect photons emitted by an alpha-particle-emitting isotope, and the system uses the adjusted model and detected photons to determine their source VOI.

Career Highlights

A key highlight of Thorek’s inventive work is the development of a method for analyzing low-count SPECT data. By combining CT-based modeling, noise analysis, and photon detection, the patented system aims to identify the source volume of detected photons.

Collaborations

Thorek is associated with Washington University. His listed coworkers include Abhinav Kumar Jha and Zekun Li.

Conclusion

Daniel Thorek’s patent focuses on a quantitative imaging approach that integrates CT information and photon measurements to locate sources within defined volumes of interest.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…