Chengdu, China

Zehou Xiang

This inventor holds 1 USPTO granted patent. Top assignee: Chengdu University of Technology. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zehou Xiang. Retrieved from https://idiyas.com/inventor/zehou-xiang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zehou Xiang: Resistivity Logging Innovation

Introduction

Zehou Xiang is an inventor based in Chengdu, China, associated with Chengdu University of Technology. His work includes an invention for correcting resistivity logging measurements affected by mud filtrate invasion.

Latest Patents

Xiang is associated with 1 patent, titled “Invasion Correction Method and System for Resistivity Logging.” The patent describes analyzing mud filtrate invasion features from an actual resistivity logging curve, identifying the invasion mechanism, and modeling the resistivity logging response. It then uses a random forest method to perform inversion and create a correction chart, ultimately outputting formation resistivity. By combining a chart-based approach with inversion, the method aims to improve the accuracy and speed of double lateral correction under invasion conditions.

Career Highlights

Xiang’s disclosed patent work connects resistivity logging analysis with computational modeling and machine-learning-based inversion. The invention focuses on improving correction of measurements used to assess formation resistivity.

Collaborations

The provided information lists Kesai Li and Jiaqi Sun as Xiang’s coworkers.

Conclusion

Zehou Xiang’s patent presents a combined chart and random forest inversion approach to resistivity logging correction, with the goal of producing accurate and efficient formation resistivity estimates.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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