Shenzhen, China

Ze Qun Jie

This inventor holds 6 USPTO granted patents and 1 published patent application. Top assignee: Tencent Technology (Shenzhen) Company Limited. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ze Qun Jie. Retrieved from https://idiyas.com/inventor/ze-qun-jie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 83.3

Average Co-Inventor Count = 1.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023-2026

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6 patents (USPTO):Explore Patents

Title: Innovations of Ze Qun Jie

Introduction

Ze Qun Jie is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of technology, particularly in image detection and recognition. With a total of four patents to his name, his work continues to influence advancements in these areas.

Latest Patents

Ze Qun Jie’s latest patents include a target detection method and apparatus, as well as a model training method and apparatus. The target detection method involves obtaining a first image and a corresponding second image from a different domain. It utilizes a cross-domain image detection model to provide target localization and classification information. Additionally, his image recognition network model training method focuses on acquiring image features and utilizing classifiers to enhance identity and pose predictions.

Career Highlights

Ze Qun Jie is currently employed at Tencent Technology (Shenzhen) Company Limited, where he applies his expertise in developing innovative solutions. His work has been instrumental in advancing the capabilities of image processing technologies.

Collaborations

He collaborates with notable colleagues, including Zheng Ge and Hao Wang, to further enhance the impact of their technological innovations.

Conclusion

Ze Qun Jie stands out as a key figure in the realm of technology, with his patents reflecting his commitment to innovation and excellence. His contributions continue to shape the future of image detection and recognition technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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