The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Apr. 22, 2021
Applicant:

Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;

Inventor:

Ze Qun Jie, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/593 (2017.01); G06F 18/213 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G06F 18/213 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/58 (2022.01);
Abstract

Embodiments of the disclosure provide a disparity map acquisition method and apparatus, a device, a control system and a storage medium. The method includes: respectively performing feature extraction on left-view images and right-view images of a captured object layer by layer through M cascaded feature extraction layers, to obtain a left-view feature map set and a right-view feature map set of each layer, M being a positive integer greater than or equal to 2; constructing an initial disparity map based on the left-view feature map set and the right-view feature map set extracted by an Mfeature extraction layer; and iteratively refining, starting from an (M−1)layer, the disparity map through the left-view feature map set and the right-view feature map set extracted by each feature extraction layer in sequence until a final disparity map is obtained based on an iteratively refined disparity map of a first layer.


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