Aomori, Japan

Yuya Iseki

This inventor holds 3 USPTO granted patents. Top assignees: Hirosaki University, National Institute of Technology, Semitec Corporation. Active years: 2025-2026.


% Patents Active = 33.3

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Yuya Iseki: Innovator in Temperature Measurement Technology

Introduction

Yuya Iseki is a notable inventor based in Aomori, Japan. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique temperature measurement device that enhances accuracy and efficiency.

Latest Patents

Yuya Iseki holds 1 patent for his invention titled "Temperature measurement device, temperature measurement method, and temperature attenuation measurement method." This device comprises a thermosensitive unit that senses temperature and a thin film thermosensitive element capable of measuring temperature by contacting a subject. Additionally, it features a protective heating element that enables heat exchange with the measurement element, ensuring precise temperature readings. The device is controlled by a processing unit that manages the temperature states of the elements involved.

Career Highlights

Throughout his career, Yuya Iseki has worked with reputable organizations, including Semitec Corporation and the National Institute of Technology. His experience in these institutions has allowed him to refine his skills and contribute to advancements in temperature measurement technologies.

Collaborations

Yuya Iseki has collaborated with notable colleagues such as Shigenao Maruyama and Takahiro Okabe. These partnerships have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Yuya Iseki's contributions to temperature measurement technology exemplify his dedication to innovation. His patented device represents a significant advancement in the field, showcasing his expertise and commitment to improving measurement accuracy.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…