The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Mar. 24, 2022
Semitec Corporation, Tokyo, JP;
National Institute of Technology, Tokyo, JP;
Hirosaki University, Aomori, JP;
Shigenao Maruyama, Aomori, JP;
Takahiro Okabe, Aomori, JP;
Yuya Iseki, Aomori, JP;
Takashi Nonaka, Aomori, JP;
Takuma Kogawa, Aomori, JP;
Yasushi Hosokawa, Aomori, JP;
Manabu Orito, Tokyo, JP;
SEMITEC Corporation, Tokyo, JP;
National Institute of Technology, Tokyo, JP;
HIROSAKI UNIVERSITY, Aomori, JP;
Abstract
Provided is a temperature calibration method that makes it possible to efficiently calibrate temperature in a short time and enhance temperature calibration accuracy. This temperature calibration method uses a temperature calibration device () comprising a temperature calibration block () having formed therein a placement part () for a reference temperature sensor () and a temperature sensor (T) to be calibrated. In this temperature calibration method, a temperature state in a gradual temperature variation transition process of the temperature calibration block () is taken to be a calibration temperature. The temperature calibration device () comprises: a vacuum-insulated container () comprising a vacuum region (Va) surrounding the temperature calibration block () and an accommodation part for accommodating the temperature calibration block (); and a Peltier module () that is thermally coupled to the temperature calibration block ().