Aomori, Japan

Takahiro Okabe

This inventor holds 3 USPTO granted patents. Top assignees: Hirosaki University, National Institute of Technology, Semitec Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Okabe. Retrieved from https://idiyas.com/inventor/takahiro-okabe-3szyw443

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 33.3

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: The Innovations of Takahiro Okabe

Introduction

Takahiro Okabe is a notable inventor based in Aomori, Japan. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique temperature measurement device that enhances accuracy and efficiency.

Latest Patents

Takahiro Okabe holds 1 patent for his invention titled "Temperature measurement device, temperature measurement method, and temperature attenuation measurement method." This device comprises a thermosensitive unit that senses temperature, a thin film thermosensitive element for measurement, and a protective heating element that enables heat exchange. The device is designed to maintain a specific temperature state, allowing for precise temperature readings.

Career Highlights

Throughout his career, Takahiro Okabe has worked with reputable organizations such as Semitec Corporation and the National Institute of Technology. His experience in these institutions has contributed to his expertise in temperature measurement technologies.

Collaborations

Takahiro has collaborated with notable colleagues, including Shigenao Maruyama and Yuya Iseki. These partnerships have fostered innovation and development in his field.

Conclusion

Takahiro Okabe's contributions to temperature measurement technology exemplify the spirit of innovation. His patented device showcases his commitment to advancing scientific understanding and practical applications in temperature measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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