Location History:
- Jiangsu, CN (2022)
- Nanjing, CN (2023)
Company Filing History:
Years Active: 2022-2025
Title: Yuxiang Wu: Innovator in Defect Detection Technologies
Introduction
Yuxiang Wu is a prominent inventor based in Jiangsu, China, known for his significant contributions to the field of defect detection technologies. With a total of three patents to his name, he has developed innovative methods that enhance the efficiency and accuracy of defect detection in industrial environments.
Latest Patents
Yuxiang Wu's latest patents include a "Method for feature detection of complex defects based on multimodal data." This patent outlines a comprehensive approach that involves feature extraction of multimodal data, multimodal feature cross-guided learning, multimodal feature fusion, and defect classification and regression. The method aims to improve the capability of detecting complex defects in industrial settings, thereby ensuring higher production efficiency.
Another notable patent is the "Subtle defect detection method based on coarse-to-fine strategy." This method involves acquiring data through a charge-coupled device (CCD) camera, constructing a defect area location network, and preprocessing the image to identify defect positions. The process culminates in the quantitative extraction and segmentation of subtle defects, showcasing Wu's innovative approach to defect detection.
Career Highlights
Yuxiang Wu is affiliated with the Nanjing University of Aeronautics and Astronautics, where he continues to advance research in defect detection technologies. His work has garnered attention for its practical applications in improving industrial manufacturing processes.
Collaborations
Some of his notable coworkers include Dawei Li and Jun Wang, who contribute to the collaborative efforts in research and development within the field.
Conclusion
Yuxiang Wu's innovative patents and contributions to defect detection technologies highlight his role as a leading inventor in this critical area. His work not only enhances the efficiency of industrial processes but also sets a foundation for future advancements in defect detection methodologies.