The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Apr. 24, 2023
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Jun Wang, Nanjing, CN;

Zhongde Shan, Nanjing, CN;

Shuyi Jia, Nanjing, CN;

Dawei Li, Nanjing, CN;

Yuxiang Wu, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/73 (2017.01); G06T 2207/20016 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A subtle defect detection method based on coarse-to-fine strategy, including: (S1) acquiring data of an image to be detected via a charge-coupled device (CCD) camera; (S2) constructing a defect area location network and preprocessing the image to be detected to initially determine a defect position; (S3) constructing a defect point detection network; and training the defect point detection network by using a defect segmentation loss function; and (S4) subjecting subtle defects in the image to be detected to quantitative extraction and segmentation via the defect point detection network.


Find Patent Forward Citations

Loading…