Shuyi Jia

Title: Shuyi Jia: Innovator in Subtle Defect Detection

Introduction

Shuyi Jia is a prominent inventor based in Nanjing, China. She has made significant contributions to the field of defect detection through her innovative methods. Her work focuses on enhancing the accuracy and efficiency of identifying subtle defects in various applications.

Latest Patents

Shuyi Jia holds a patent for a "Subtle defect detection method based on coarse-to-fine strategy." This method involves several key steps: acquiring data of an image to be detected via a charge-coupled device (CCD) camera, constructing a defect area location network, preprocessing the image to initially determine a defect position, and constructing a defect point detection network. The network is trained using a defect segmentation loss function, allowing for quantitative extraction and segmentation of subtle defects in the image.

Career Highlights

Shuyi Jia is affiliated with Nanjing University of Aeronautics and Astronautics, where she contributes to research and development in her field. Her innovative approach to defect detection has garnered attention and recognition within the academic and industrial communities.

Collaborations

Shuyi has collaborated with notable colleagues, including Jun Wang and Zhongde Shan, who share her commitment to advancing technology in defect detection.

Conclusion

Shuyi Jia's work in subtle defect detection exemplifies her dedication to innovation and excellence in her field. Her contributions continue to impact the way subtle defects are identified and addressed in various industries.