The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Oct. 25, 2022
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Jun Wang, Nanjing, CN;

Yuxiang Wu, Nanjing, CN;

Dawei Li, Nanjing, CN;

Yuan Zhang, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/80 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/806 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
Abstract

The present disclosure disclose a method for feature detection of complex defects based on multimodal data, including feature extraction of multimodal data, multimodal feature cross-guided learning, multimodal feature fusion, and defect classification and regression. Feature extraction networks for multimodal two-dimensional data are constructed first, and a defect data set is sent to the networks for training; during training, cross-guided learning is implemented by using a multimodal feature cross-guidance network; then feature fusion is performed by using a weight adaptive method; and finally a defect detection task is implemented by using a classification subnetwork and a regression subnetwork. In the present disclosure, fusion of the multimodal data in a process of feature detection of the complex defects can be implemented efficiently, a capability of detecting the complex defects in an industrial environment can be improved more effectively, and production efficiency in an industrial manufacturing process is ensured.


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