Beijing, China

Yuxi Li

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuxi Li. Retrieved from https://idiyas.com/inventor/yuxi-li-3zix6uwx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Yuxi Li: Innovator in Deep Supervision Object Detection

Introduction

Yuxi Li is a prominent inventor based in Beijing, China. She has made significant contributions to the field of image processing, particularly in the area of deep supervision object detection. Her innovative work aims to reduce resource usage while enhancing the efficiency of image processing systems.

Latest Patents

Yuxi Li holds a patent for a "Method and system of deep supervision object detection for reducing resource usage." This patent outlines a system, article, and method that utilizes depth-wise dense blocks to improve image processing capabilities. Her invention is a testament to her expertise and commitment to advancing technology.

Career Highlights

Yuxi Li is currently employed at Intel Corporation, where she continues to push the boundaries of innovation in her field. Her work at Intel has allowed her to collaborate with other talented professionals and contribute to groundbreaking projects.

Collaborations

Throughout her career, Yuxi has worked alongside notable colleagues, including Jianguo Li and Jiuwei Li. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Yuxi Li's contributions to deep supervision object detection exemplify her dedication to innovation and technology. Her patent and work at Intel Corporation highlight her role as a leading inventor in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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