Tokyo, Japan

Yuushi Takehara

This inventor holds 1 USPTO granted patent. Top assignee: Nec Viewtechnology, Ltd.. Active years: 2004.


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Yuushi Takehara: Innovator in Digital Imaging Technology

Introduction

Yuushi Takehara is a prominent inventor based in Tokyo, Japan. He is known for his contributions to digital imaging technology, particularly in the field of digital image reproduction. His innovative approach has led to the development of a unique apparatus that enhances the way images and sounds are reproduced from digital still cameras.

Latest Patents

Takehara holds a patent for a "Digital image reproducing apparatus and method." This invention provides a solution for easily reproducing images and sounds recorded by digital still cameras. The apparatus features an input interface for image data, a converter that transforms this data into displayable formats, and a display that produces visible images based on the converted data. This patent showcases his commitment to improving user experience in digital photography.

Career Highlights

Yuushi Takehara is associated with NEC Viewtechnology, Ltd., where he has made significant contributions to the company's technological advancements. His work has been instrumental in developing innovative solutions that cater to the evolving needs of digital imaging.

Collaborations

Takehara has collaborated with notable colleagues, including Michio Yokozawa and Masaharu Yamaguchi. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

In summary, Yuushi Takehara is a key figure in the realm of digital imaging, with a focus on enhancing the reproduction of images and sounds. His patent and work at NEC Viewtechnology, Ltd. reflect his dedication to innovation in this field.

Profile summary based on public USPTO records.
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