Tokyo, Japan

Nec Viewtechnology, Ltd.


USPTO Granted Patents = 125

% Expired Patents = 49.6

Forward Citations = 1,419

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99 inventors (with patents filed for the assignee):

goldMedal Kunitaka Furuichi (8 out of 10 patents)

silverMedal Naoto Fukasawa (7 out of 87 patents)

bronzeMedal Hisakazu Aoyanagi (6 out of 10 patents)

4.  Michio Kobayashi (6 out of 15 patents)

5.  Youichi Tamura (6 out of 15 patents)

6.  Jun Ogawa (6 out of 12 patents)

7.  Eiki Matsuo (6 out of 9 patents)

8.  Atsushi Kato (5 out of 63 patents)

9.  Motoyasu Utsunomiya (5 out of 33 patents)

10.  Hiroyuki Kobayashi (4 out of 111 patents)

11.  Eisaku Shouji (4 out of 8 patents)

12.  Kazuo Mochizuki (4 out of 33 patents)

13.  Tsunao Nagasaki (4 out of 5 patents)

14.  Daisuke Moriwaki (3 out of 7 patents)

15.  Katsuyuki Takeuchi (3 out of 15 patents)


Core Competencies:
Projection Display
Image Quality
Liquid Cooling
Multiscreen Systems
Optical System
Video Processing
Picture Quality
Color Adjustment
Device Control
Light Source
Image Transmission
Distortion Correction

125 patents:

Company Overview
NEC Viewtechnology, Ltd., based in Tokyo, specializes in advanced projection display technology, focusing on delivering high-quality visual experiences. The company is recognized for its innovations in image quality, employing techniques such as liquid cooling and sophisticated optical systems to enhance performance. Additionally, NEC Viewtechnology is dedicated to developing multiscreen systems and advanced video processing solutions, ensuring superior picture quality and precise color adjustment for various applications across diverse industries.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

125 Patents

#487 in Tokyo

#987 in Japan

#6,406 in the World

Tokyo, JP
Tokyo, Japan
Forward Citations = 1,419

99 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nec Viewtechnology, Ltd.. Retrieved from https://idiyas.com/company/nec-viewtechnology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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