This inventor holds 1 USPTO granted patent. Top assignee: Yokogawa Electric Corporation. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Yuuji Miyata: Innovator in Event Analysis Technology
Introduction
Yuuji Miyata is a prominent inventor based in Musashino, Japan. He has made significant contributions to the field of event analysis technology. His innovative work has led to the development of a unique patent that enhances the understanding of event relationships.
Latest Patents
Yuuji Miyata holds a patent for an "Event analysis apparatus, event analysis method and computer program product." This invention includes an associated event group preparation unit that calculates the degree of association between events based on an event matrix. It prepares an associated event group for each event, establishing a probabilistic cause-and-effect relationship model using a Bayesian network. The model is based on the event matrix for each associated event group. Additionally, the invention features an improvement candidate pattern receiving unit that determines conditions for improvement candidates based on attributes and conditional probabilities. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model that conforms to the set improvement candidate patterns.
Career Highlights
Yuuji Miyata is currently employed at Yokogawa Electric Corporation, where he continues to innovate and contribute to advancements in technology. His work is characterized by a strong focus on improving event analysis methodologies.
Collaborations
Yuuji collaborates with Yuichi Sakuraba, working together to enhance their research and development efforts in the field of event analysis.
Conclusion
Yuuji Miyata's contributions to event analysis technology through his innovative patent demonstrate his expertise and commitment to advancing the field. His work continues to influence the way events are analyzed and understood in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
