The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Nov. 20, 2015
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Yuuji Miyata, Musashino, JP;
Yuichi Sakuraba, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
An associated event group preparation unit calculates a degree of association between the events on the basis of an event matrix, and prepares an associated event group for each event. A cause-and-effect relationship model establishment unit establishes a probabilistic cause-and-effect relationship model by a Bayesian network on the basis of the event matrix, for each associated event group. An improvement candidate pattern receiving unit receives a setting of an improvement candidate pattern in which a condition of an event to be set as an improvement candidate is determined by attributes of the base point event and the associated event and a conditional probability between the base point event and the associated event. A pattern analysis unit extracts a probabilistic cause-and-effect relationship model conforming to any one of the set improvement candidate patterns, from the established probabilistic cause-and-effect relationship models for each event.