This inventor holds 5 USPTO granted patents and 3 EPO patents. Top assignee: Omron Corporation. Active years: 2017-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Shiga, JP (2017)
- Ritto, JP (2018 - 2019)
- Rittou, JP (2020)
Company Filing History:
Years Active: 2017-2020
Title: Yutaka Abe: Inventor in Industrial Control and Monitoring
Introduction
Yutaka Abe is an inventor based in Ritto, Japan, whose patent work includes industrial control systems, programmable logic controllers (PLCs), and methods for detecting abnormalities. He is associated with Omron Corporation and has 5 patents.
Latest Patents
Abe’s recent patent work includes “Emulation of a Control System and Control Method for Abnormality Detection Parameter Verification.” The invention describes a control system that collects data about a controlled target, generates feature quantities from that data, and detects abnormalities using parameters informed by machine learning. An information-processing device can emulate the monitoring process using data from the control device, supporting verification of abnormality-detection parameters.
Another patent, “Control Device, Control System, Control Method for Control Device, and Control Method for Control System,” addresses compatibility checks when user configuration data or firmware is written to a PLC. The PLC uses a combination table stored on a recording medium to determine whether the new data is suitable for use with the firmware or configuration data already stored in the device.
Career Highlights
Abe’s disclosed inventions focus on practical aspects of industrial automation, including monitoring controlled equipment and managing PLC software configurations. His work at Omron Corporation connects these areas with the reliability and maintenance of control systems.
Collaborations
Abe’s listed coworkers include Shinsuke Kawanoue and Takehiko Hioka. Their shared association with Omron Corporation reflects a professional setting focused on industrial technologies and control systems.
Conclusion
Yutaka Abe’s patent portfolio highlights contributions to machine-learning-assisted abnormality detection and compatibility management for PLCs, advancing the reliability of industrial control systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
