This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Hitachi High-Tech Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Yuta Tagawa - Innovator in Defect Inspection Technology
Introduction
Yuta Tagawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of defect inspection technology. His innovative approach has led to the development of a unique device that enhances the accuracy and efficiency of defect detection.
Latest Patents
Yuta Tagawa holds a patent for a defect inspection device and method. This system features a scanning device that rotates and drives the sample stage, allowing for the adjustment of relative positions between the sample and the illumination optical system. It includes multiple detection optical systems that focus on scattered illumination light from the sample's surface. Additionally, a series of sensors convert this scattered light into electrical signals, which are then processed by a signal processing device. This device is capable of extracting comparison locations based on a θ coordinate set in an rθ circular coordinate system, with the sample's center as the origin point. He has 1 patent to his name.
Career Highlights
Yuta Tagawa is currently employed at Hitachi High-Tech Corporation, where he continues to innovate and develop advanced technologies. His work has been instrumental in improving defect inspection processes, which are critical in various manufacturing sectors.
Collaborations
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Conclusion
Yuta Tagawa's contributions to defect inspection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to enhancing quality control processes in manufacturing.