Kawaguchi, Japan

Yuta Inoue

This inventor holds 1 USPTO granted patent. Top assignee: Enplas Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuta Inoue. Retrieved from https://idiyas.com/inventor/yuta-inoue-1smkc1be

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yuta Inoue - Innovator in Electrical Component Testing

Introduction

Yuta Inoue is a notable inventor based in Kawaguchi, Japan. He has made significant contributions to the field of electrical component testing through his innovative designs and patents. His work focuses on enhancing the efficiency and reliability of testing equipment.

Latest Patents

Yuta Inoue holds a patent for a "Contact probe and socket for electrical component testing." This invention provides a contact probe that includes a tubular structure with a receiving cavity. The design features a contact part for connecting to a terminal of a first electrical component. Additionally, it incorporates a spring with a unique coil structure and a plunger that allows for smooth operation during testing.

Career Highlights

Inoue is currently employed at Enplas Corporation, where he continues to develop innovative solutions for electrical testing. His work has been instrumental in advancing the technology used in this field. He has a total of 1 patent to his name, showcasing his commitment to innovation.

Collaborations

Yuta Inoue collaborates with Yasuyuki Sakamoto, a fellow innovator at Enplas Corporation. Their partnership has led to the development of cutting-edge technologies in electrical component testing.

Conclusion

Yuta Inoue's contributions to the field of electrical component testing highlight his innovative spirit and dedication to improving technology. His patent reflects a significant advancement in testing methodologies, and his work continues to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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