Contact probe and socket for electrical component testing

Abstract

Embodiments of the present application provide a contact probe and a socket for electrical component testing. The contact probe includes a tubular structure within which a receiving cavity is formed, wherein a contact part for contacting a terminal of a first electrical component is provided at a first end of the tubular structure; a spring provided in the receiving cavity, wherein a coil outer diameter of a first end of the spring is greater than a coil outer diameter of a middle of the spring; a plunger connected to the tubular structure in a slidable manner, wherein a first end of the plunger is provided with a spring positioning structure, which comprises a transition part and an eccentric structure body connected to the transition part; wherein the eccentric structure body is arranged offset from a central axis of the plunger, and one end of the eccentric structure body is sheathed by the first end of the spring, one end of the transition part connected to the eccentric structure body is provided with an inclined surface, so that the spring is not contacted with the transition part when the spring is compressed; a second end of the plunger protrudes from a second end of the tubular structure.