Osaka, Japan

Yusuke Shiozaki

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Nanophoton Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yusuke Shiozaki. Retrieved from https://idiyas.com/inventor/yusuke-shiozaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Yusuke Shiozaki: Innovator in Optical Microscopy

Introduction

Yusuke Shiozaki is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of optical microscopy, showcasing his innovative spirit through his patented inventions. His work is particularly focused on enhancing the capabilities of optical measurement techniques.

Latest Patents

Yusuke Shiozaki holds a patent for an optical microscope and spectroscopic measurement method. This invention includes a sophisticated design featuring a light source, a first scanner for scanning the light beam on a sample, and an objective lens that focuses the light beam onto the sample. The patent also describes a spectroscope with a slit for incoming light and a detector for outgoing light, along with a first relay optical system that utilizes off-axis parabolic mirrors to optimize the light path.

Career Highlights

Yusuke Shiozaki is associated with Nanophoton Corporation, where he continues to develop cutting-edge optical technologies. His work has positioned him as a key figure in the advancement of optical measurement methods, contributing to both academic and practical applications in the field.

Collaborations

Some of his notable coworkers include Minoru Kobayashi and Shogo Kawano, who collaborate with him on various projects within Nanophoton Corporation.

Conclusion

Yusuke Shiozaki's innovative contributions to optical microscopy exemplify the impact of dedicated inventors in advancing technology. His patent reflects a commitment to enhancing measurement techniques, which can lead to significant advancements in various scientific fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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