Tokyo, Japan

Yusuke Omuro

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hitachi Metals, Ltd.. Active years: 2020.


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yusuke Omuro - Innovator in Measurement Systems

Introduction

Yusuke Omuro is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement systems, particularly in the manufacturing of shafts with holes. His innovative approach has led to the development of a unique measurement system that enhances precision in machining processes.

Latest Patents

Yusuke Omuro holds a patent for a "Measurement system and method of manufacturing shaft with hole." This system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument features a base that is fixed to a tool shaft of a machining apparatus, along with a first rod and a second rod connected to the base. Each rod is equipped with a measuring head that irradiates the object to be measured with measurement light. The measurement control device calculates the thickness of the object based on the distances acquired from the measuring heads and the ranging device.

Career Highlights

Yusuke Omuro is currently employed at Hitachi Metals, Ltd., where he continues to innovate and develop advanced measurement technologies. His work has been instrumental in improving the accuracy and efficiency of manufacturing processes in the industry.

Collaborations

Yusuke has collaborated with esteemed colleagues such as Shigeyoshi Fujihara and Koji Utsumi. Their combined expertise has contributed to the advancement of measurement systems and methodologies.

Conclusion

Yusuke Omuro's contributions to measurement systems exemplify the importance of innovation in manufacturing. His patented technology not only enhances precision but also sets a benchmark for future developments in the field.

Profile summary based on public USPTO records.
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