Hitachi Metals, Ltd.

Yusuke Omuro

Masahiro Watanabe

Koji Utsumi

Shigeyoshi Fujihara

Shinji Kayama

A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.

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Tokyo, Japan

Yusuke Omuro