Chiba, Japan

Yusuke Inoue


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Yusuke Inoue: Innovator in Silicon Wafer Polishing Technology

Introduction

Yusuke Inoue is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of semiconductor manufacturing, particularly in the polishing of silicon wafers. His innovative approach has led to the development of a unique polishing compound that addresses common issues faced in the industry.

Latest Patents

Yusuke Inoue holds a patent for a polishing method for silicon wafers. This method utilizes a polishing compound designed to reduce stains on the surface of the workpiece. The invention involves a dispersion containing 1-30 wt. % of metal oxide particles with an average diameter of 8-500 nm, along with acid or alkali and salt, maintaining a pH of 7-12. The polishing compound is enhanced by the inclusion of a water-soluble organic solvent, which further improves its effectiveness. Additionally, the patent outlines edge polishing and surface polishing methods using this innovative compound.

Career Highlights

Yusuke Inoue is currently employed at Speedfam-Pec Co., Ltd., where he continues to advance his research and development efforts. His work has been instrumental in improving the efficiency and quality of silicon wafer polishing processes, which are critical in the semiconductor industry.

Collaborations

Yusuke has collaborated with notable colleagues, including Hiroaki Tanaka and Akitoshi Yoshida. Their combined expertise has contributed to the successful development and implementation of innovative polishing techniques.

Conclusion

Yusuke Inoue's contributions to silicon wafer polishing technology exemplify the importance of innovation in the semiconductor industry. His patented methods and compounds are paving the way for improved manufacturing processes, showcasing his role as a key inventor in this field.

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