Yusuke Ilda

Title: Yusuke Ilda: Innovator in Pattern Inspection Technology

Introduction

Yusuke Ilda is a notable inventor based in Yokkaichi, Japan. He has made significant contributions to the field of pattern inspection technology. His innovative work has led to the development of a unique patent that enhances the accuracy of defect detection in various substrates.

Latest Patents

Yusuke Ilda holds a patent for a "Pattern Inspection Apparatus and Pattern Inspection Method." This invention involves a method that applies light generated from a light source to a specific region of a substrate where an inspection target pattern is formed. The process includes guiding, imaging, and detecting reflected light from the substrate. It acquires detection signals for multiple wavelengths and generates added image data that includes information on wavelength and signal intensity. This data is crucial for judging whether the inspection target pattern has defects. If defects are detected, the method also identifies their position in relation to the substrate.

Career Highlights

Yusuke Ilda is currently employed at Kabushiki Kaisha Toshiba, a leading technology company. His work at Toshiba has allowed him to focus on advancing inspection technologies that are vital for various industrial applications. His expertise in this area has positioned him as a key player in the field of optical inspection.

Collaborations

Yusuke collaborates with his coworker, Makoto Kaneko, to further enhance the capabilities of their inspection technologies. Their combined efforts contribute to the ongoing innovation at Toshiba.

Conclusion

Yusuke Ilda's contributions to pattern inspection technology exemplify the importance of innovation in industrial applications. His patent reflects a significant advancement in defect detection methods, showcasing his role as a leading inventor in this field.