This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Huawei Technologies Co., Limited. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Yusi Liu - Innovator in Object Dimension Measurement
Introduction
Yusi Liu is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to object dimension measurement. His work has the potential to enhance various applications in industries that require precise measurements.
Latest Patents
Yusi Liu holds a patent for an "Object Dimension Measurement Method and Apparatus." This invention provides a method for accurately measuring the dimensions of an object without the need for specialized measuring tools. The method involves obtaining the horizontal distance between a photographing terminal and the object, as well as the vertical distance to a horizontal plane. It also includes calculating the camera's imaging angle and deflection angle, ultimately leading to the determination of the actual dimensions of the photographed object through trigonometric relationships.
Career Highlights
Yusi Liu is currently employed at Huawei Technologies Co., Limited, where he continues to innovate and develop new technologies. His work at Huawei has allowed him to collaborate with other talented professionals in the field, contributing to the company's reputation for cutting-edge technology.
Collaborations
Yusi Liu has worked alongside notable colleagues such as Xiuping Jiang and Hui Yi. Their collaborative efforts have further advanced the research and development of measurement technologies.
Conclusion
Yusi Liu's contributions to object dimension measurement technology exemplify the spirit of innovation. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving measurement methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
