The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10782119 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 22, 2020

Filed:

Feb. 11, 2015
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xiuping Jiang, Wuhan, CN;

Hui Yi, Wuhan, CN;

Yusi Liu, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/14 (2006.01); G01B 11/26 (2006.01); H04N 5/232 (2006.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01B 11/14 (2013.01); G01B 11/26 (2013.01); G06T 7/62 (2017.01); H04N 5/23245 (2013.01); H04N 5/23296 (2013.01); H04N 5/23293 (2013.01);
Abstract

An object dimension measurement method and apparatus, where the object dimension measurement method includes obtaining a horizontal distance between a photographing terminal and a photographed object or a vertical distance between the photographing terminal and a horizontal plane, obtaining a camera imaging angle when the photographing terminal photographs the photographed object, calculating a deflection angle of a camera in a vertical direction when the photographing terminal photographs the photographed object, obtaining through calculation an imaging distance of the photographed object on a display screen of the photographing terminal according to a trigonometric relationship among the horizontal distance or the vertical distance, the camera imaging angle, the deflection angle, and the imaging distance, and obtaining through conversion an actual dimension of the photographed object according to the imaging distance. Hence, an object dimension can be accurately measured without using a special measuring tool.


Find Patent Forward Citations

Jiang, Xiuping. (2020). Object dimension measurement method and apparatus (U.S. Patent No. 10782119). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10782119

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