This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Agency for Science, Technology and Research. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: Yusha Li: Innovator in Defect Detection Technology
Introduction
Yusha Li is a prominent inventor based in Singapore, known for his innovative contributions to the field of image processing. His work focuses on enhancing the capabilities of neural networks to detect defects in images, particularly cracks in various objects. With a keen interest in technology and research, Yusha has made significant strides in his field.
Latest Patents
Yusha Li holds a patent for a method titled "Defect detection in image space." This invention involves a systematic approach to training a neural network. The process includes detecting holes in training images, transforming these images to suppress non-crack information, and ultimately training the neural network to identify cracks effectively. This patent showcases Yusha's commitment to advancing image analysis technology.
Career Highlights
Yusha is affiliated with the Agency for Science, Technology and Research, where he applies his expertise in neural networks and image processing. His role at this esteemed institution allows him to collaborate with other talented professionals and contribute to groundbreaking research in technology.
Collaborations
Yusha has worked alongside notable colleagues, including Ying Sun and Wei Xiong. Their collaborative efforts have further enriched the research environment and fostered innovation within their projects.
Conclusion
Yusha Li's contributions to defect detection technology exemplify the impact of innovative thinking in the field of image processing. His patent and work at the Agency for Science, Technology and Research highlight his dedication to advancing technology for practical applications.