The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Dec. 08, 2020
Applicant:

Agency for Science, Technology and Research, Singapore, SG;

Inventors:

Jierong Cheng, Singapore, SG;

Ying Sun, Singapore, SG;

Wei Xiong, Singapore, SG;

Wenyu Chen, Singapore, SG;

Yusha Li, Singapore, SG;

Ying Quan, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01); G06T 7/149 (2017.01); G06V 10/34 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 7/0002 (2013.01); G06T 7/11 (2017.01); G06T 7/149 (2017.01); G06V 10/34 (2022.01); G06V 10/82 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

This invention relates to a method for training a neural network, comprising detecting a hole in each training image of a plurality of training images; transforming each training image into a transformed image, to suppress non-crack information in the training image; and training a neural network using the transformed images, to detect cracks in images (i.e. in objects in images).


Find Patent Forward Citations

Loading…