Kyungki-do, South Korea

Yury N Yuryev

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yury N Yuryev. Retrieved from https://idiyas.com/inventor/yury-n-yuryev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Yury N Yuryev: Innovator in Electron Spectroscopy

Introduction

Yury N Yuryev is a notable inventor based in Kyungki-do, South Korea. He has made significant contributions to the field of electron spectroscopy, particularly through his innovative patent.

Latest Patents

Yury holds a patent for an "Electron Spectroscopic Analyzer Using X-rays." This advanced device includes an X-ray generator that produces X-rays, an optical system designed to detect charged particles emitted from an object irradiated with these X-rays, and a vacuum system maintained at low pressure. The design also features a blocking unit that prevents elements other than the X-rays from entering the optical system, ensuring accurate analysis.

Career Highlights

Yury is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of technology and innovation. His work has been instrumental in enhancing the capabilities of electron spectroscopic analysis.

Collaborations

Yury has collaborated with talented coworkers, including Chang-bin Lim and Jae-cheol Lee, contributing to the advancement of their projects and innovations.

Conclusion

Yury N Yuryev's contributions to electron spectroscopy exemplify the spirit of innovation in technology. His patent and work at Samsung Electronics Co., Ltd. highlight his role as a key figure in advancing scientific research and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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