Xi'an, China

Yuqin Li

This inventor holds 1 USPTO granted patent. Top assignee: Xi 'an Chishine Optoelectronics Technology Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuqin Li. Retrieved from https://idiyas.com/inventor/yuqin-li-7kx3vmwl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yuqin Li and Hybrid Three-Dimensional Profile Measurement

Introduction

Yuqin Li is an inventor based in Xi’an, China. Her work includes a patent for a hybrid light measurement method designed to measure the three-dimensional profiles of objects with different surface properties.

Latest Patents

Li’s listed patent is “Hybrid Light Measurement Method for Measuring Three-Dimensional Profile.” The method uses a MEMS laser projector to project both a laser stripe and a fringe pattern. It then matches the resulting measurements to obtain parallax and uses binocular stereo vision to reconstruct the object’s three-dimensional profile.

The invention combines laser-stripe and fringe-pattern measurement in one system, without requiring additional hardware. Its projector can produce multiple laser stripes, with the stated aim of improving measurement precision and speed. Li is listed as having 1 patent.

Career Highlights

Li is associated with Xi’an Chishine Optoelectronics Technology Co., Ltd. Her listed invention applies MEMS projection technology to a measurement system that can use different optical measurement approaches for objects with varying surface characteristics.

Collaborations

The provided information lists Quan Li and Tao Yang as Li’s coworkers. It does not specify their roles in the patent or the invention.

Conclusion

Yuqin Li’s listed patent presents a hybrid approach to three-dimensional profile measurement, combining laser-stripe projection, fringe patterns, and binocular stereo vision in a single system.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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