The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2021
Filed:
Jan. 29, 2020
Xi 'an Chishine Optoelectronics Technology Co., Ltd., Xi'an, CN;
Xiang Zhou, Xi'an, CN;
Yuqin Li, Xi'an, CN;
Huanhuan Li, Xi'an, CN;
Quan Li, Xi'an, CN;
Tao Yang, Xi'an, CN;
Li Ma, Xi'an, CN;
Di Guo, Xi'an, CN;
Dong Yao, Xi'an, CN;
Abstract
A hybrid light measurement method for measuring a three-dimensional profile comprises: Step 1 using a MEMS laser projector to realize projection of a laser stripe and a fringe pattern: and Step 2 performing matching to obtain a parallax, and incorporating a binocular stereo vision to perform reconstruction. The present disclosure employs MEMS projection technology to realize a hybrid measurement system capable of performing laser stripe measurement and fringe pattern measurement, thereby realizing quick measurement of three-dimensional profiles of objects having different surface properties. The present disclosure enables laser stripe measurement and fringe pattern measurement to be performed by the same measurement system without needing any additional hardware equipment. The projection device used in the present disclosure enables projection of multiple laser stripes, thereby increasing measurement precision and speed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile