This inventor holds 1 USPTO granted patent. Top assignee: Xi 'an Chishine Optoelectronics Technology Co., Ltd.. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Di Guo - Innovator in Hybrid Light Measurement Technology
Introduction
Di Guo is a prominent inventor based in Xi'an, China. He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique hybrid light measurement method that enhances the precision and efficiency of three-dimensional profile measurements.
Latest Patents
Di Guo holds a patent for a "Hybrid light measurement method for measuring three-dimensional profile." This method involves two key steps: first, using a MEMS laser projector to project a laser stripe and a fringe pattern, and second, performing matching to obtain a parallax while incorporating binocular stereo vision for reconstruction. This technology allows for quick measurement of three-dimensional profiles of objects with varying surface properties. The system is designed to perform both laser stripe and fringe pattern measurements without the need for additional hardware, thus streamlining the measurement process. The projection device can project multiple laser stripes, which significantly increases measurement precision and speed.
Career Highlights
Di Guo is associated with Xi'an Chishine Optoelectronics Technology Co., Ltd., where he applies his expertise in optical technologies. His work has been instrumental in advancing the capabilities of measurement systems in various applications.
Collaborations
Di Guo collaborates with talented individuals such as Xiang Zhou and Yuqin Li, contributing to the innovative environment at his company.
Conclusion
Di Guo's contributions to hybrid light measurement technology exemplify the impact of innovation in the field of optical measurements. His work not only enhances measurement precision but also simplifies the process, making it accessible for various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile