Singapore, Singapore

Yuqi Wang

This inventor holds 1 USPTO granted patent. Top assignee: Seagate Technology Incorporated. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuqi Wang. Retrieved from https://idiyas.com/inventor/yuqi-wang-0vi9nk9j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Innovations of Yuqi Wang in Modal Frequency Response Testing

Introduction

Yuqi Wang is an accomplished inventor based in Singapore, SG. He has made significant contributions to the field of modal frequency response testing. His innovative approach has led to the development of a unique apparatus that enhances the testing of various objects in a gravitational field.

Latest Patents

Yuqi Wang holds a patent for a method titled "Free-state modal frequency response testing." This invention involves suspending a test object from a support member and exciting it with a predetermined waveform force. The method allows for qualitative characterization of the test object based on its observed modal frequency response to the excitation. He has 1 patent to his name.

Career Highlights

Yuqi Wang is currently employed at Seagate Technology Incorporated, where he continues to push the boundaries of innovation in his field. His work at Seagate has positioned him as a key player in advancing technology related to modal frequency response testing.

Collaborations

Yuqi has collaborated with notable colleagues, including YiRen Hong and Kok Tong Soh. Their combined expertise contributes to the innovative environment at Seagate Technology.

Conclusion

Yuqi Wang's contributions to modal frequency response testing exemplify the spirit of innovation. His patent and work at Seagate Technology highlight his commitment to advancing technology in this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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