The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7924020 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 12, 2011

Filed:

Sep. 17, 2007
Applicants:

Yuqi Wang, Singapore, SG;

Yiren Hong, Singapore, SG;

Takkoon Ooi, Singapore, SG;

Yichao MA, Singapore, SG;

Kok Tong Soh, Singapore, SG;

Mingchou Lin, Singapore, SG;

Inventors:

Yuqi Wang, Singapore, SG;

YiRen Hong, Singapore, SG;

Takkoon Ooi, Singapore, SG;

YiChao Ma, Singapore, SG;

Kok Tong Soh, Singapore, SG;

MingChou Lin, Singapore, SG;

Assignee:

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 27/26 (2006.01); G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and associated method is provided for suspending a test object in a gravitational field from a support member, exciting the test object by noncontactingly engaging it with a predetermined waveform force, and characterizing the test object qualitatively in relation to an observed modal frequency response of the test object to the excitation.


Find Patent Forward Citations

Wang, Yuqi. (2011). Free-state modal frequency response testing (U.S. Patent No. 7924020). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7924020

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…