Wuhan, China

Yuping Shen

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Lvyin Technology (Wuhan) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuping Shen. Retrieved from https://idiyas.com/inventor/yuping-shen-68fjnpsw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yuping Shen and Ultrasonic Measurement Innovation.

Introduction

Yuping Shen is an inventor associated with Wuhan, China. Her work includes a patented approach for using ultrasonic waves to measure pre-tightening force and temperature in solid materials.

Latest Patents

Shen is associated with 1 patent: “Method, Use, and Device for Ultrasonic Double-Wave Measurement of Pre-Tightening Force and Temperature of Solid Material.”

The method measures the travel times of two ultrasonic wave modes in a solid material under a known temperature and stress state, then compares them with measurements taken under an unknown state. It uses temperature and pre-tightening-force influence coefficients for materials of the same specification and geometry. By applying a first- or second-order Taylor approximation to the relative changes in wave travel time, the method jointly determines the material’s pre-tightening force and temperature.

Career Highlights

Shen is associated with Lvyin Technology (Wuhan) Co., Ltd. Her patent work reflects an application of ultrasonic measurement to assessing conditions within solid materials.

Collaborations

Her named collaborators include Kun Li and Xuxiang Zhu. They are also associated with the patent work described here.

Conclusion

Yuping Shen’s patent presents a method for estimating both pre-tightening force and temperature through ultrasonic double-wave measurements, linking her work in Wuhan with practical material measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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