The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Nov. 12, 2021
Lvyin Technology (Wuhan) Co., Ltd., Wuhan, CN;
LVYIN TECHNOLOGY (WUHAN) CO., LTD., Wuhan, CN;
Abstract
A method for the ultrasonic double-wave measurement includes: obtaining a first mode wave time-of-flight and a second mode wave time-of-flight of an ultrasonic double-wave of a solid material at a first temperature and stress state; measuring a first mode wave time and a second mode wave time of the ultrasonic double-wave of the solid material in an unknown state; obtaining a first mode wave temperature influence coefficient and a second mode wave temperature influence coefficient of the solid material, and a first mode wave pre-tightening force influence coefficient and a second mode wave pre-tightening force influence coefficient in the solid material to be measured having the same specification and geometric shape; and obtaining a relative change relationship of ultrasonic double-wave time-of-flight according to the first-order or second-order Taylor approximation, and jointly solving to obtain a measured pre-tightening force and a measured temperature.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile