Tampa, FL, United States of America

YunJo Jeong

This inventor holds 1 USPTO granted patent. Top assignee: University of South Florida. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: YunJo Jeong. Retrieved from https://idiyas.com/inventor/yunjo-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of YunJo Jeong in Atomic Scale Patterning

Introduction

YunJo Jeong is a notable inventor based in Tampa, Florida. He has made significant contributions to the field of material science, particularly in the area of atomic scale patterning. His innovative approach has the potential to impact various applications in technology and engineering.

Latest Patents

YunJo Jeong holds a patent for a method of forming patterns in layered materials at an atomic scale. This method involves arranging a two-dimensional layered material on a base material that comprises one or more Moiré interferences. Additionally, it includes the process of adding or removing material at specific locations of the Moiré interferences. This patent showcases his expertise and creativity in manipulating materials at a fundamental level.

Career Highlights

YunJo Jeong is affiliated with the University of South Florida, where he continues to advance his research and innovation. His work is characterized by a commitment to exploring new methodologies in material formation and manipulation. With a patent portfolio that includes 1 patent, he is recognized for his contributions to the scientific community.

Collaborations

YunJo Jeong collaborates with Michael Cai Wang, enhancing the scope and impact of their research endeavors. Their partnership exemplifies the importance of teamwork in driving innovation and achieving breakthroughs in their field.

Conclusion

YunJo Jeong's work in atomic scale patterning represents a significant advancement in material science. His innovative methods and collaborative efforts continue to pave the way for future discoveries and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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