This inventor holds 1 USPTO granted patent. Top assignee: Fuji Electric Co., Ltd.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Yukitoshi Otani: Innovator in Disk Substrate Measurement
Introduction
Yukitoshi Otani is a notable inventor based in Koganei, Japan. He has made significant contributions to the field of optical measurement, particularly in the analysis of disk substrates. His innovative approach has led to the development of a unique method for measuring the inner stress state of disk substrates.
Latest Patents
Yukitoshi Otani holds a patent for a "Method of measuring an inner stress state of disk substrate." This method provides a means to automatically analyze the inner state of a disk quantitatively. The process involves using linearly polarized light from a light source, which enters a retarder to create a desired elliptically polarized state. The elliptically polarized light is then passed through a half-wave plate to rotate the direction of the principal axis of the ellipse. The light is expanded into two dimensions by lens systems to obtain planar information and is transmitted through a disk substrate. The birefringence of the specimen, which depends on the inner stress state and polymer orientation state, alters the phase of the light. The light wave with its phase changed is then passed through a polarizer arranged perpendicular to the principal axis of the retarder, and the CCD detects the light wave as a light intensity.
Career Highlights
Yukitoshi Otani is associated with Fuji Electric Co., Ltd., where he has been able to apply his expertise in optical measurement. His work has contributed to advancements in the field, particularly in the analysis of materials used in various technologies.
Collaborations
He has collaborated with notable colleagues such as Toshiyuki Kanno and Eiji Ishibashi, further enhancing the innovative work being done at Fuji Electric Co., Ltd.
Conclusion
Yukitoshi Otani's contributions to the field of optical measurement, particularly through his patented method for analyzing disk substrates, highlight his role as an innovator. His work continues to influence advancements in technology and material analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile