Mie Mie, Japan

Yukio Katamura

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Kioxia Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukio Katamura. Retrieved from https://idiyas.com/inventor/yukio-katamura-g8wgg48x

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 7.1

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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3 patents (USPTO):Explore Patents

Title: Yukio Katamura: Innovator in Semiconductor Technology

Introduction

Yukio Katamura is a prominent inventor based in Mie, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique semiconductor device and its manufacturing method.

Latest Patents

Yukio Katamura holds 1 patent for a semiconductor device and method of manufacturing a semiconductor device. According to one embodiment, the method involves forming a plurality of stacked bodies on a substrate, with each stacked body containing multiple semiconductor chips. The process further includes the formation of first wires that connect the stacked bodies to each other, followed by the application of a resin layer over the stacked bodies and wires. The resin layer is then thinned until the first wires are exposed.

Career Highlights

Yukio Katamura is associated with Kioxia Corporation, a leading company in the semiconductor industry. His work at Kioxia has been instrumental in advancing semiconductor technologies and enhancing device performance.

Collaborations

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Conclusion

Yukio Katamura's contributions to semiconductor technology exemplify the innovative spirit of modern inventors. His patent reflects a significant advancement in the manufacturing processes of semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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