This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Jeol Ltd.. Active years: 2009-2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009-2017
Title: Innovations of Yukihito Kondoh
Introduction
Yukihito Kondoh is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged-particle beam technology. With a total of 2 patents, his work has advanced the capabilities of electron microscopy and aberration correction.
Latest Patents
Kondoh's latest patents include a two-stage dodecapole aberration corrector for charged-particle beams. This innovative aberration corrector features two stages of dodecapole elements, each with poles arranged in a specific order. The design allows for the production of magnetic fields that are identical in absolute value but opposite in sense relative to the optical axis. His second patent is a specimen holder for electron microscopes. This holder incorporates two levers that carry probes for current measurement, allowing for precise movement in multiple directions.
Career Highlights
Kondoh is currently employed at Jeol Ltd., a company known for its advanced electron microscopy and imaging technologies. His work at Jeol Ltd. has positioned him as a key figure in the development of innovative solutions in the field.
Collaborations
Some of his notable coworkers include Shunji Deguchi and Hidetaka Sawada. Their collaborative efforts have contributed to the advancement of technology in their respective fields.
Conclusion
Yukihito Kondoh's contributions to the field of charged-particle beam technology and electron microscopy are noteworthy. His innovative patents reflect his dedication to advancing scientific research and technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile