The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2009

Filed:

May. 25, 2006
Applicants:

Shunji Deguchi, Tokyo, JP;

Yukihito Kondoh, Tokyo, JP;

Inventors:

Shunji Deguchi, Tokyo, JP;

Yukihito Kondoh, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A specimen holder has two levers on which probes for current measurement are carried. The levers are in contact with a spherical body, the spherical body acting as a pivotal point. When the levers are pushed by micrometer heads, the probes move in the X-direction. When the levers are pulled, the probes are pushed back by springs and move in the −X-direction. When the first lever is pushed by a further micrometer head, the first probe rotates about the spherical body and thus moves in the Y-direction. When the first lever is pulled, the first probe is pushed back by the first spring and moves in the −Y-direction. The second probe is moved along the Y-axis by similarly manipulating a further micrometer head. The two probes can be moved along the Z-axis by similarly manipulating other micrometer heads.


Find Patent Forward Citations

Loading…