Kusatsu, Japan

Yukihiro Tonomura

This inventor holds 1 USPTO granted patent. Top assignee: Nec Machinery Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukihiro Tonomura. Retrieved from https://idiyas.com/inventor/yukihiro-tonomura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations by Yukihiro Tonomura

Introduction

Yukihiro Tonomura is a notable inventor based in Kusatsu, Japan. He has made significant contributions to the field of semiconductor device fabrication. His innovative approach has led to advancements in machine diagnostics, particularly in the context of drive members.

Latest Patents

Tonomura holds a patent for a method related to machines having drive members. The patent, titled "Machines having drive member and method for diagnosing the same," focuses on diagnosing fabrication machines for semiconductor devices. This method allows for the recognition of damage conditions in components responsible for fast driving. It also enables the prediction of component failures. The system utilizes vibration information from a motor controller, which is sent to a machine controller. This information is stored and processed, allowing for real-time display of the drive member's condition. Consequently, the machine can self-diagnose, preventing potential failures without the need for external analyzers.

Career Highlights

Yukihiro Tonomura is associated with NEC Machinery Corporation, where he applies his expertise in machine diagnostics and semiconductor technology. His work has been instrumental in enhancing the reliability and efficiency of fabrication machines.

Collaborations

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Conclusion

Yukihiro Tonomura's innovative contributions to semiconductor device fabrication and machine diagnostics highlight his role as a leading inventor in the field. His patent demonstrates a significant advancement in self-diagnosing technology, which can greatly improve operational efficiency in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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