Kyoto, Japan

Yuki Yoshinaga

This inventor holds 1 USPTO granted patent. Top assignee: Arkray, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Yoshinaga. Retrieved from https://idiyas.com/inventor/yuki-yoshinaga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Yuki Yoshinaga: Innovator in Optical Detection Technology

Introduction

Yuki Yoshinaga is a prominent inventor based in Kyoto, Japan. She has made significant contributions to the field of optical detection technology. Her innovative approach has led to the development of a method that enhances the reliability of optical detection apparatus.

Latest Patents

Yuki Yoshinaga holds a patent for a method of verifying the performance of optical detection apparatus and the standard reagent used therefor. This method allows for the accurate verification of optical signal detection and temperature control in optical detection units. By utilizing a standard sample containing a nucleic acid sequence, the performance of the detection unit can be assessed with high reliability.

Career Highlights

Yuki is currently employed at Arkray, Inc., where she continues to advance her research and development efforts. Her work focuses on improving the accuracy and efficiency of optical detection systems. With her innovative mindset, she has established herself as a key player in her field.

Collaborations

Yuki collaborates with notable colleagues, including Mitsuharu Hirai and Toshiya Hosomi. Together, they work on various projects aimed at enhancing optical detection technologies.

Conclusion

Yuki Yoshinaga's contributions to optical detection technology exemplify her dedication to innovation and excellence. Her patented method showcases her ability to solve complex problems in the field. Through her work at Arkray, Inc., she continues to push the boundaries of what is possible in optical detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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