The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2014

Filed:

Dec. 25, 2007
Applicants:

Mitsuharu Hirai, Kyoto, JP;

Toshiya Hosomi, Kyoto, JP;

Yuki Yoshinaga, Kyoto, JP;

Inventors:

Mitsuharu Hirai, Kyoto, JP;

Toshiya Hosomi, Kyoto, JP;

Yuki Yoshinaga, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12M 1/00 (2006.01); C12M 1/34 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01); G01J 1/10 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided in which with respect to an optical detection apparatus including an optical detection unit and a temperature control unit, whether optical signal detection and temperature control are performed accurately, i.e. the performance thereof, can be verified simply with high reliability. With respect to an optical detection apparatus including an optical detection unit for detecting an optical signal of a sample and a temperature control unit for controlling temperature of the sample, the optical signal detection performance and temperature control performance are verified by the following method. First, a standard sample containing a nucleic acid sequence and a strand complementary thereto that have a known optical signal intensity and Tm value is provided, the temperature of the standard sample is increased or decreased with the temperature control unit, and optical signal intensity of the standard sample is measured with the detection unit. On the other hand, the melting temperature of the standard sample is determined from a change in the optical signal intensity accompanying a change in the temperature. The measured optical signal intensity and melting temperature of the standard sample are compared to the known optical signal intensity and melting temperature of the standard sample, respectively, and thereby it is verified whether the optical signal detection performance of the detection unit and the temperature control performance of the temperature control unit are accurate.


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