Yuki Numata

Title: Yuki Numata: Innovator in Charged Particle Beam Technology

Introduction

Yuki Numata is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of charged particle beam technology, holding 2 patents that enhance the functionality and usability of charged particle beam devices. Her work focuses on improving image quality and operational efficiency in scientific applications.

Latest Patents

Yuki Numata's latest patents include a "Charged Particle Beam Device and Method for Setting Condition in Charged Particle Beam Device." This invention assists operators in setting observation conditions to acquire images with desired quality, such as contrast, without relying solely on trial and error. The device features a stage for sample placement, a charged particle optical system for irradiation, detectors for electron detection, and a control unit that manages the system based on operator-set conditions. Additionally, her patent for an "Electronic Apparatus, Index Calculating Method, and Computer Program Product" describes an electronic apparatus that calculates performance indices based on sensor data, enhancing the efficiency of electronic devices.

Career Highlights

Throughout her career, Yuki Numata has worked with notable companies such as Hitachi High-Tech Corporation and Toshiba Corporation. Her experience in these organizations has allowed her to develop innovative solutions that address complex challenges in the field of charged particle technology.

Collaborations

Yuki has collaborated with esteemed colleagues, including Hirofumi Sato and Shigeru Kawamata, contributing to advancements in their shared field of expertise.

Conclusion

Yuki Numata's contributions to charged particle beam technology exemplify her innovative spirit and dedication to enhancing scientific imaging techniques. Her patents reflect a commitment to improving operational efficiency and image quality in complex systems.