Kyoto, Japan

Yuki Kimura

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Omron Corporation. Active years: 2019-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Kimura. Retrieved from https://idiyas.com/inventor/yuki-kimura-zobt8qe8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2019-2021

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2 patents (USPTO):Explore Patents

Title: Yuki Kimura: Innovator in Data Communication and Inspection Systems

Introduction

Yuki Kimura is a prominent inventor based in Kyoto, Japan. She has made significant contributions to the field of data communication and inspection systems. With a total of 2 patents to her name, her work has garnered attention in the technological community.

Latest Patents

Yuki's latest patents include a data communication relay device and an inspection system. The inspection system is designed to examine the external features of an object and is equipped with a control device that manages the inspection device. These innovations reflect her commitment to enhancing technology in practical applications.

Career Highlights

Yuki Kimura is currently employed at Omron Corporation, a leading company in automation and control technology. Her role at Omron allows her to work on cutting-edge projects that push the boundaries of innovation in her field.

Collaborations

Throughout her career, Yuki has collaborated with notable colleagues, including Masaru Horie and Akira Matsui. These partnerships have contributed to the development of her innovative ideas and projects.

Conclusion

Yuki Kimura is a talented inventor whose work in data communication and inspection systems continues to impact the industry. Her contributions and collaborations highlight her dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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