The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Mar. 02, 2017
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/00 (2017.01); B25J 9/00 (2006.01); G01N 21/88 (2006.01); G01B 11/10 (2006.01); G01B 11/24 (2006.01); G01N 21/95 (2006.01); G01N 21/952 (2006.01); G01B 11/14 (2006.01); G01B 11/245 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B25J 9/0087 (2013.01); G01B 11/105 (2013.01); G01B 11/14 (2013.01); G01B 11/245 (2013.01); G01B 11/2416 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/952 (2013.01); G01N 21/9515 (2013.01); H04N 7/181 (2013.01); G01N 2021/8887 (2013.01);
Abstract
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device;
Kimura, Yuki. (2019). Inspection system (U.S. Patent No. 10417754). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10417754
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile