Yujia Yang

Title: Yujia Yang: Innovator in Integrated Optical Field Sampling

Introduction

Yujia Yang is a prominent inventor based in Vaud, Switzerland. He has made significant contributions to the field of optoelectronics, particularly through his innovative patent that focuses on integrated optical field sampling.

Latest Patents

Yujia Yang holds a patent for an "Integrated Optical Field Sampling Platform." This invention is directed towards an all-on-chip, optoelectronic device designed for sampling arbitrary, low-energy, near-infrared waveforms under ambient conditions. The solid-state integrated detector utilizes optical-field-driven electron emission from resonant nanoantennas, achieving petahertz-level switching speeds by generating on-chip attosecond electron bursts. Additionally, the patent discloses a cross-correlation technique based on perturbation of local electron field emission rates, allowing for the full characterization of arbitrary electric fields down to 1 femtojoule, and/or on the order of 500 kV/m, using plasmonic nanoantennas.

Career Highlights

Throughout his career, Yujia Yang has worked with prestigious institutions such as the Massachusetts Institute of Technology and the University of California. His work has been instrumental in advancing the understanding and application of optoelectronic devices.

Collaborations

Yujia has collaborated with notable colleagues, including Marco Turchetti and Mina Bionta. Their combined expertise has contributed to the success of various projects in the field.

Conclusion

Yujia Yang's innovative work in integrated optical field sampling showcases his dedication to advancing technology in optoelectronics. His contributions are paving the way for future developments in this exciting field.