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For the Inventor, By the Inventor

Nagaokakyo, Japan

Yuji Toyota

This inventor holds 13 USPTO granted patents. Top assignees: Murata Manufacturing Co., Ltd., Murata Manufacturing Co., Ltd., Murata Manufacturingco., Ltd.. Active years: 2000-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Toyota. Retrieved from https://idiyas.com/inventor/yuji-toyota-4ww2th2h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 13

% Patents Active = 84.6

Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 17(Granted Patents)


Location History:

  • Kanazawa, JP (2000 - 2002)
  • Nagaokakyo, JP (2014 - 2024)

Company Filing History:

goldMedal11 out of 13,796 
 
Murata Manufacturing Co., Ltd.
 patents
silverMedal1 out of 761 
 
Murata Manufacturing Co., Ltd.
 patents
bronzeMedal1 out of 150 
 
Murata Manufacturingco., Ltd.
 patents

Years Active: 2000-2026

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13 patents (USPTO):Explore Patents
1. 12603638 - Acoustic wave device (2026-04-14),
2. 11985903 - Wiring electrode (2024-05-14),
3. 11509289 - Composite component and mounting structure therefor (2022-11-22),
4. 10840879 - Surface acoustic wave device (2020-11-17),
5. 10644671 - Surface acoustic wave device (2020-05-05),
6. 10298274 - Multiplexer, transmission device, and reception device (2019-05-21),
7. 10171113 - Multiplexer, transmission device, and reception device (2019-01-01),
8. 9748194 - Electronic device (2017-08-29),
9. 9473104 - Surface acoustic wave filter (2016-10-18),
10. 9426897 - Electronic component and method for manufacturing electronic component (2016-08-23),
11. 8875362 - Method of manufacturing piezoelectric device (2014-11-04),
12. 6340635 - Resist pattern, process for the formation of the same, and process for the formation of wiring pattern (2002-01-22),
13. 6156672 - Method of forming dielectric thin film pattern and method of forming (2000-12-05),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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